Reconstructing layer composition with photoelectrons
Reconstructing layer composition with photoelectrons - S.A. Astatine Skip to content Home News Calendar ATtentie Association The Board Previous Boards Committees Major Events Europe Trip Study Trip Kick-In Alumniday Astatine Song History Membership Honorary Members & Members of Merit Mental Health Study advisors Confidential Contact Person (CCP) Training and workshops Mental well-being International Association Education Advanced Technology Nanotechnology Robotics Educational Award Books Partners Companies ASML MESA+ ETC Nederland Vacancy bank Bachelor Assignments Side jobs & Internships Webapps Contact S.A. Astatine The study association for open-minded engineers Menu Home News Calendar ATtentie Association The Board Previous Boards Committees Major Events Europe Trip Study Trip Kick-In Alumniday Astatine Song History Membership Honorary Members & Members of Merit Mental Health Study advisors Confidential Contact Person (CCP) Training and workshops Mental well-being International Association Education Advanced Technology Nanotechnology Robotics Educational Award Books Partners Companies ASML MESA+ ETC Nederland Vacancy bank Bachelor Assignments Side jobs & Internships Webapps Contact Activities this week October 30, 2026 VriMiBo De TAP November 2, 2026 M1 evaluation Search for: Search Facebook Linked-In Instagram Powered by Verbosa & WordPress . Home Job Reconstructing layer composition with photoelectrons Reconstructing layer composition with photoelectrons XUV Optics Posted 4 years ago Reconstructing layer composition with photoelectrons Contact: Dr. P. Phadke, p.phadke@utwente.nl Project nature: Experimental, Data analysis, Simulation X-Ray Photoelectron spectroscopy is a powerful, non-destructive tool to reliably evaluate near surface compositions of thin films up to about 5 nm depth. Angle resolved XPS adds additional information which encodes the depth dependent concentrations of various materials of interest. The inverse problem of reconstructing the in-depth concentrations from experimental photoelectron (PE) intensities can be solved either for simple cases of well-defined layers or by ignoring effects of interfaces between thin layers. This (bachelors/masters) assignment aims to study and develop a method to unravel the PE intensity contributions from layers with defined interfaces and stacking order. The work done here will grant you hands on experience of thin film deposition and characterization using XPS. It will also challenge your skills in data processing, programming and maths. Are you up for the challenge? Job Features Job Category Bachelor Assignment, Final assignment Apply For This Job Attach Resume * Submit Close Previous Post Advanced Transparent Optical Materials (ATOM) study for Mosaic Target Depositions Next Post Privacy Policy Code of Conduct Social Media Facebook Linked-In Instagram Back to Top Astatine uses cookies to recognize your repeat visits, as well as to analyze the traffic on the site. By clicking accept, or using our site, you consent to the use of cookies unless you have disabled them. Accept Read More Privacy & Cookies Policy Close Privacy Overview This website uses cookies to improve your experience while you navigate through the website. Out of these, the cookies that are categorized as necessary are stored on your browser as they are essential for the working of basic functionalities of the website. We also use third-party cookies that help us analyze and understand how you use this website. These cookies will be stored in your browser only with your consent. You also have the option to opt-out of these cookies. But opting out of some of these cookies may affect your browsing experience. Necessary Necessary Always Enabled Necessary cookies are absolutely essential for the website to function properly. This category only includes cookies that ensures basic functionalities and security features of the website. These cookies do not store any personal information. Non-necessary Non-neces